Characterization of semiconductor detectors using IBIC imaging ...

Characterization of semiconductor detectors using. IBIC imaging method. Tuesday, 27 November 2018 16:10 (20 minutes). The Ion Beam Induced Current (IBIC) ...

Characterization of semiconductor detectors using IBIC imaging method. Page 2. Laboratory for ion beam interactions. Ruđer Bošković Institute, Croatia https ...

Semiconductor characterization by scanning ion beam induced ...

With the advent of highly focused ion beams, IBIC spectroscopy turned into a spectro-microscopic technique able not only to measure, but also to image basic ...

Semiconductor Characterization by Scanning Ion Beam Induced ...

As an example, Figure 3 shows the optical image and the relevant IBIC map of a n+/p polycrystalline solar cell irradiated with 2 MeV He ions.

[1609.00236] Semiconductor characterization by scanning ion beam ...

In order to illustrate the importance of using a rigorous mathematical formalism, we present in this paper a benchmark IBIC experiment aimed to ...

Characterisation of semiconductor materials and devices by th..|INIS

AbstractAbstract. [en] The ion beam induced charge (IBIC) analysis is a nuclear microprobe technique that is developed for imaging electronic transport ...

Semiconductor characterization by scanning ion beam induced ...

... The IBIC technique is a scanning microscopy technique in which MeV ion beams are used as probes to image electronic properties of ...

Study and characterisation of semiconductor radiation detectors ...

... detectors based on semiconductor ... Study and characterisation of semiconductor radiation detectors using the IBIC technique. Thumbnail Image ...

Semiconductor Characterization by Scanning Ion Beam Induced ...

The ion beam induced charge (IBIC) technique is a scanning microscopy technique which uses finely focused MeV ion beams as probes to measure ...

Characterisation of SiC by IBIC and other IBA techniques

In the case of SiC single crystal radiation detectors, Li and proton beams with a wide range of energies were used to probe the charge collection efficiency at ...

Analysis of Integrated Circuits and Semiconductor Materials Using ...

We refer the interested reader to a recent book1 and extensive review6 for more information. IBIC Imaging. As a charged particle traverses through a material, ...

Semiconductor Characterization by Scanning Ion Beam Induced ...

Semiconductor Characterization by Scanning Ion Beam Induced Charge (IBIC) Microscopy · E. Vittone, Ž. Pastuović, +5 authors. E. Colombo ...

Analysis of Integrated Circuits and Semiconductor Materials Using ...

In addition to these atomic effects, the other major differences between IBIC and EBIC are that an MeV ion will typically reach depths an order ...

LATERAL IBIC CHARACTERIZATION OF SINGLE CRYSTAL ... - arXiv

properties in wide band gap semiconductors employed as ionizing radiation detectors. Since its development in the early 1990's, IBIC microscopy found ...

IBIC characterization of charge transport in CdTe:Cl - CiteSeerX

using ion beam induced charge (IBIC) imaging. The IBIC technique combines ... collection efficiency (CCE) of a semiconductor detector. In high purity ...

Semiconductor Characterization by Scanning Ion Beam Induced ...

The ion beam induced charge (IBIC) technique is a scanning microscopy technique which uses finely focused MeV ion beams as probes to measure and image the ...

Untitled - SPIE Digital Library

found in the literature. Another important application of IBIC is the characterization of field defects and carrier mobility in semiconductor detectors".

Sub-Micron Resolution of Localized Ion Beam Induced Charge ...

Both IBIC and. EBIC have been used to microscopically image defects in semiconductor devices. In 2007, Simon et al. used. 2 MeV proton IBIC to detect damage ...

IBIC characterization of charge transport in CdTe:Cl (Journal Article ...

... using ion-beam-induced charge (IBIC) imaging. ... Charge transport properties in CdZnTe detectors ... CDTE SEMICONDUCTOR DETECTORS · CHARGE COLLECTION

SiC detectors: A review on the use of silicon carbide as radiation ...

Thanks to the large energy gap, SiC detectors are characterized by low leakage currents, even at high reverse bias, and are therefore very low noise. At room ...